METHOD AND DEVICE FOR MONITORING ELECTRIC COMPONENTS IN A PICK-AND-PLACE DEVICE FOR SUBSTRATES

摘要

The invention relates to a method and to a device for monitoring electric components in a pick-and-place device for substrates. The underside of a pick-up (2) is monitored by an optical scanning means (7) during the pick-up phase and during the placing phase of a component (10). A lift drive (3) for the pick-up (2) is provided with a position sensor (5) that is linked with a control device (6). The scanning means (7) emits and receives a scanning beam (22) oriented transversally to the direction of lift and is likewise coupled with the control device (6), thereby allowing to monitor the underside of the pick-up (2) in a direct time-related manner with the picking and placing of the component (10). The various lift positions are saved and compared when a threshold value of the received scanning beam (22) is exceeded so that the inventive device also allows for a monitoring of the height of the component.