发明名称 Aqueous dispersion for chemical mechanical polishing of insulating films
摘要 <p>The invention provides an aqueous dispersion for chemical mechanical polishing that can limit scratches of a specific size to a specific number. When using the aqueous dispersion for chemical mechanical polishing of an interlayer insulating film with an elastic modulus of no greater than 20GPa as measured by the nanoindentation method, the number of scratches with a maximum length of 1 mu m or greater is an average of no more than 5 per unit area of 0.01mm<2> of the polishing surface. The aqueous dispersion contains a scratch inhibitor agent and an abrasive.</p>
申请公布号 EP1138733(A2) 申请公布日期 2001.10.04
申请号 EP20010107381 申请日期 2001.03.26
申请人 JSR CORPORATION 发明人 MOTONARI, MASAYUKI;HATTORI, MASAYUKI;KAWAHASHI, NOBUO
分类号 B24B37/00;C09G1/02;C09K3/14;H01L21/304;H01L21/306;H01L21/3105;(IPC1-7):C09G1/02;H01L21/310 主分类号 B24B37/00
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