| 摘要 |
<p>A probe capable of simply being positioned with respect to a laminated sheet and measuring a high impedance reliably, comprising a probe needle for contacting an internal conductor layer forming a high frequency circuit inside the laminated sheet, and a ground electrode for contacting another conductor layer separate from this internal conductor layer, wherein the probe needle is connected to an external impedance measuring instrument and is used to send a high-frequency signal to the internal conductor layer from the instrument and transmit a high-frequency signal reflected off the layer to the measuring instrument. A contact end edge of the ground electrode to contact the other conductor layer is formed into an annular shape coaxially surrounding the probe needle to allow some portion of the annular contact end edge surrounding the probe needle to contact the other conductor layer when the probe needle is allowed to contact a portion of the internal conductor layer.</p> |
