发明名称 Skew calibration means and a method of skew calibration
摘要 Automatic test equipment for memory device testing with elements providing a high accuracy of transferring and receiving signals when testing a semiconductor device under test (DUT) by intelligent skew calibration of a timing system. The device for automatic skew calibration of a transceiver comprises a plurality of input registers for transmitting signals; a plurality of output registers for receiving signals; a main clock driver for generating a main clock signal; a reference clock driver for generating reference signals for calibrating the registers; the reference clock driver being associated with the main clock driver; and a plurality of phase shifters comprising at least one set of phase shifters associated with each plurality of registers, for the relative alignment of the register's timing within each plurality. The calibration is performed using a common time base which is distributed by means of a transmission line having predetermined wave characteristics.
申请公布号 US6298465(B1) 申请公布日期 2001.10.02
申请号 US19990342227 申请日期 1999.06.29
申请人 PROCESS INTELLIGENCE LIMITED 发明人 KLOTCHKOV ILYA VALERIEVICH
分类号 G01R31/28;G01R31/317;G01R31/319;G11C29/56;(IPC1-7):G11B27/00 主分类号 G01R31/28
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