发明名称 X-ray examination apparatus
摘要 An X-ray examination apparatus is provided with a DC voltage source which is to be connected to a maines voltage and whereto there are connected an accumulator with a charging circuit for this the accumulator as well as a high voltage generator for an X-ray tube. The accumulator is charge in a standby mode; the accumulator can be discharged via the high voltage generator. There is provided a power gate circuit via which power up to a maximum value can be drawn from the mains, the accumulator being chargeable for as long as this maximum value has not yet been reached; when a power beyond said maximum value is required, the surplus beyond this maximum value is delivered by the accumulator via said power gate circuit.
申请公布号 US6298116(B1) 申请公布日期 2001.10.02
申请号 US20000606393 申请日期 2000.06.29
申请人 U.S. PHILIPS CORPORATION 发明人 METHLEY PETER BRIAN;VAN DER HEIJDEN THEODORUS ANTONIUS
分类号 H05G1/10;H02J7/34;H05G1/12;(IPC1-7):H05G1/06 主分类号 H05G1/10
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