发明名称 In-situ etch of multiple layers during formation of local interconnects
摘要 An in-situ etching process for creating local interconnects in a semiconductor device includes using a single etching tool to: etch through a masked dielectric layer to a stop layer using a mixture of C4F8/CH3F/Ar gasses; etch away the mask layer using a mixture of O2/Ar gasses; and etch through the stop layer using a mixture of CH3F/O2 gasses. The semiconductor device is not removed from the etching tool between the different etchings. The method then includes depositing conductive material to form local interconnects within the openings that were etched.
申请公布号 US6297167(B1) 申请公布日期 2001.10.02
申请号 US19970924574 申请日期 1997.09.05
申请人 ADVANCED MICRO DEVICES, INC. 发明人 WANG FEI;KAI JAMES K.;EN WILLIAM G.
分类号 H01L21/311;H01L21/768;(IPC1-7):H01L21/027 主分类号 H01L21/311
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