发明名称 Method to obtain a low resistivity and conformity chemical vapor deposition titanium film
摘要 A method of forming titanium nitride barrier layers that are highly conformal, have high step coverage and low resistivity through a two stage deposition process is described. Low temperature deposition of titanium nitride barrier layer provides material of high conformity and good step coverage but of high resistivity. High temperature deposition of titanium nitride barrier layer yields material of low resistivity. Thus, a titanium nitride barrier layer deposited in separate steps at low temperature and high temperature by the method of the present invention is particularly suited for use in modern devices of increasing density that are characterized by narrow and deep contact holes.
申请公布号 US6297555(B1) 申请公布日期 2001.10.02
申请号 US19980218780 申请日期 1998.12.22
申请人 LSI LOGIC CORPORATION 发明人 ZHAO JOE W.;HSIA WEI-JEN;CATABAY WILBUR G.
分类号 C23C16/18;H01L21/28;H01L21/285;H01L21/768;H01L23/522;(IPC1-7):H01L23/52;H01L21/476 主分类号 C23C16/18
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