发明名称 |
System and method for manufacturing test of a physical layer transceiver |
摘要 |
A system and method for testing the most complex portions of transceiver devices integrated into digital VLSI chips. The testing is performed in a manufacturing environment with minimal external hardware and using a combination of test-specific circuitry and pattern algorithms built into a mixed signal transceiver implementing a test methodology suitable for application and measurement on a digital tester.
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申请公布号 |
US6298458(B1) |
申请公布日期 |
2001.10.02 |
申请号 |
US19990225111 |
申请日期 |
1999.01.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
CRANFORD, JR. HAYDEN C.;GUDE EIRIK;IADANZA JOSEPH A.;OWCZARSKI PAUL A.;RAYMOND JONATHAN H. |
分类号 |
G01R31/28;H04B17/00;H04L12/26;(IPC1-7):G01R31/28;G01R31/08;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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