发明名称 Process for determining impurities in refractory materials
摘要 A small sample of a refractory material, e.g., about 0.1 g to about 10 g, is heated to at least 1000° C., generally under a pressure of less than about 10-5 Torr. Evolved hydrogen-containing gases and/or carbon-containing gases are monitored, e.g., by mass spectrometry, and, based on the amount of the evolved gases, the concentration of hydrogen and/or carbon in the sample is calculated. It is therefore possible to accurately determine the hydrogen and carbon concentration from a small sample of a material, by a process much less burdensome than conventional techniques.
申请公布号 US6297058(B1) 申请公布日期 2001.10.02
申请号 US19990231025 申请日期 1999.01.14
申请人 AGERE SYSTEMS OPTOELECTRONICS GUARDIAN CORP. 发明人 REENTS, JR. WILLIAM DAVID
分类号 C03B37/07;G01N33/00;G01N33/38;G02B6/00;(IPC1-7):G01N33/38 主分类号 C03B37/07
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