发明名称 Method and apparatus for preventing contamination in a hot plate oven
摘要 A method and an apparatus for preventing particle contamination in a hot plate oven for curing a coating layer on a wafer surface are disclosed. The apparatus of a hot plate oven for curing a coating layer on the wafer without particle contamination can be constructed with an oven body of elongated shape; a plurality of metal heating blocks situated in the oven body arranged in a matrix form with a preset spacing there in-between; a pair of metal wafer carrying blades positioned in preset spacing between the plurality of metal heating blocks for moving both in a longitudinal direction of the oven body to traverse a wafer and in a vertical direction to load or unload the wafer from a planar top surface of the metal heating blocks; and an interlocking circuit for detecting an electrical short between any one of the pair of metal wafer carrying blades and any one of the plurality of metal heating blocks and for stopping the movement of the pair of metal wafer carrying blades when such electrical short is detected.
申请公布号 US6297480(B1) 申请公布日期 2001.10.02
申请号 US20000746273 申请日期 2000.12.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD 发明人 LIU LIANG HUANG;LIN SHU SHING
分类号 H01L21/00;(IPC1-7):F27D11/00 主分类号 H01L21/00
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