发明名称 EXPOSURE SYSTEM
摘要 PROBLEM TO BE SOLVED: To enable the illuminating optical system of an exposure system to arbitrarily control the width of isolated lines of a reticle. SOLUTION: The exposure system is provided with a correction filter 1 which adjusts the quantity of light emitted from a light source 7 at every deformed light pattern in addition to a diaphragm mechanism 3 having various kinds of deformed light patterns for deforming illumination. Since the illumination in the image forming plane of an exposed object to be transferred can be made uniform, a plurality of isolated lines scattered in the pattern of the reticle can be transferred with accurate line widths.
申请公布号 JP2001267205(A) 申请公布日期 2001.09.28
申请号 JP20000072133 申请日期 2000.03.15
申请人 NEC CORP 发明人 HATANO HIROSHI
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址