发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To prevent adhesion of a product on the side and the surface of a pattern, when a ferroelectric thin film formed on a metallic thin film is to be dry-etched. SOLUTION: An adhering product can be removed by immersing a substrate in H2O, whose temperature is 40 deg.C-90 deg.C after a ferroelectric film is etched, by using a mixed gas constituted of Ar, C2F6 and Cl2.
申请公布号 JP2001267302(A) 申请公布日期 2001.09.28
申请号 JP20000079431 申请日期 2000.03.22
申请人 SHARP CORP 发明人 URASHIMA HITOSHI;ISHIHARA KAZUYA
分类号 H01L21/302;H01L21/3065;H01L21/316;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L21/302
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