| 摘要 |
PROBLEM TO BE SOLVED: To realize short TAT and easy connection check, regarding an IP mounted ASIC. SOLUTION: A plurality of megacells IP1,..., IPm are mounted on a chip 11. Test circuits 12-1,..., 12-m are arranged inside the megacells IP1,..., IPm, respectively. The megacells IP1,..., IPm having the test circuits 12-1,..., 12-m are reused as an IP cell (design property), for example. A test control circuit 13 is arranged inside the chip 11. The megacells IP1,..., IPm are subjected to test or connection check based on test signals IP1-TEST, IPm-TEST.
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