发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To decrease, cell area and increase ferroelectric capacitor area, without having to adopt a COP structure. SOLUTION: The device has a substrate 11, a diffusion region 15B, a layer insulation film 16 formed thereon, a hole 21, which is formed on the layer insulation film 16 and communicates with the diffusion region 15B, a lower electrode 23 which is formed inside the hole 21 and electrically connected to the diffusion region 15B, a ferroelectric film 24 formed on the lower electrode 23 and an upper electrode 25 formed on the ferroelectric film 24. A ferroelectric capacitor is constituted of the lower electrode 23, the ferroelectric film 24 and the upper electrode 25.
申请公布号 JP2001267520(A) 申请公布日期 2001.09.28
申请号 JP20000078916 申请日期 2000.03.21
申请人 TOSHIBA CORP 发明人 KANETANI HIROYUKI
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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