SORTING METHOD FOR IMAGE PICKUP ELEMENT, IMAGE PICKUP ELEMENT AND IMAGE PICKUP DEVICE

摘要

PROBLEM TO BE SOLVED: To prevent image quality degradation generated at the time of OB clamp by OB pixel defects within the range of the specification conditions (temperature/exposure time) of an image pickup device. SOLUTION: In this sorting method of the image pickup element used for the object image fetch of the image pickup device, a pixel defect information detection part S2 for detecting pixel defect levels for the respective pixels of the image pickup element under the exposure time and temperature conditions applied based on the output signals of the image pickup element and a defect decision part for deciding success or failure for sorting by a first decision method S3 and a second judgment method S4-S6 different from S3 for defect information detected by S2 are used. To the pixel part of the OB area of the image pickup element, the first decision method S3 for which a defect decision level is set more strictly compared with the second decision method S4-S6 and based on the condition that the defect level in an object pixel area does not exceed a prescribed level is applied. To the pixel part of an effective pixel area other than the OB area, the second decision method S4-S6 is applied and the success or the failure is devided.