发明名称 METHOD AND APPARATUS FOR ANALYZING VAPORIZED METAL
摘要 A laser beam is passed through a vaporized metal layer, and the change in its luminous flux density is measured to determine the concentration of the element under analysis included in the vaporized metal. The wavelength of the laser beam is adjusted such that it is 0.001 to 0.03 nm off the center of the absorption wavelength of the element under analysis. The range of concentration measurement can be expanded.
申请公布号 WO0171320(A1) 申请公布日期 2001.09.27
申请号 WO2000JP07146 申请日期 2000.10.16
申请人 NKK CORPORATION;YOSHIDA, KAZUKIYO;ISHIDA, TOMOHARU;AKIYOSHI, TAKANORI;CHINO, ATSUSHI;SUMI, IKUHIRO;KAWABATA, RYO 发明人 YOSHIDA, KAZUKIYO;ISHIDA, TOMOHARU;AKIYOSHI, TAKANORI;CHINO, ATSUSHI;SUMI, IKUHIRO;KAWABATA, RYO
分类号 G01N21/31;(IPC1-7):G01N21/31 主分类号 G01N21/31
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