发明名称 Method and system for dicing wafers, and semiconductor structures incorporating the products thereof
摘要 A method and system for dicing a semiconductor wafer providing a structure with greatly reduced backside chipping and cracking, as well as increased die strength. Semiconductor chip structures obtained from wafers diced according to this invention are also encompassed.
申请公布号 US2001023979(A1) 申请公布日期 2001.09.27
申请号 US20010855617 申请日期 2001.05.15
申请人 BROUVILLETTE DONALD W.;COOK ROBERT F.;FERENCE THOMAS G.;HOWELL WAYNE J.;LINIGER ERIC G.;MENDELSON RONALD L. 发明人 BROUVILLETTE DONALD W.;COOK ROBERT F.;FERENCE THOMAS G.;HOWELL WAYNE J.;LINIGER ERIC G.;MENDELSON RONALD L.
分类号 B23D59/00;B28D5/02;H01L21/301;H01L21/607;H01L21/78;H01L29/06;(IPC1-7):H01L29/06 主分类号 B23D59/00
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