| 摘要 |
PROBLEM TO BE SOLVED: To solve such a problem that when memory macro-cells of various kinds incorporated in a semiconductor integrated circuit are tested and a pause test is performed, it takes a long time to perform testing successively. SOLUTION: There is a test method using a BIST circuit in a method for testing a memory macro-cell, but in order to perform efficiently and easily a pause test of many memory macro-cells incorporated in a semiconductor integrated circuit, such a circuit other than the BIST circuit is incorporated in the semiconductor integrated circuit that memory macro-cells of which address directions are the same are made a unit with which control is performed by the BIST, even if a time for writing a checker pattern in the memory macro- cell being timing of pause is different depending on BIST controllers, the circuit that makes the BIST controller wait until a checker patter is written in the BIST controller is mounted on the semiconductor integrated circuit in addition to the BIST controller. |
