发明名称 Semiconductor integrated circuit device and a method of manufacturing thereof
摘要 A gate electrode of a field-effect transistor used as a peripheral circuit is constituted by the same gate electrode structure as a double-level gate electrode structure of nonvolatile memory cells, and a contact hole for connecting those conductive films constituting the gate electrode is provided at a location which two-dimensionally overlaps an active area within a plane of the gate electrode. A hole for connecting between the two layers of the gate electrode of a first field-effect transistor used as perpheral circuit is provided at a location which two-dimensionally overlaps the active area within the plane of the gate electrode, and a hole for connecting between the two layers of the gate electrode of a second field-effect transistor used as a peripheral circuit is provided at a location which two-dimensionally overlaps an isolation area within the plane of the gate electrode. The gate length of the first field-effect transistor is longer than the gate length of the second field-effect transistor, and the gate width of the first field-effect transistor is wider than the gate width of the second field-effect transistor.
申请公布号 US2001024859(A1) 申请公布日期 2001.09.27
申请号 US20010811598 申请日期 2001.03.20
申请人 TAKAHASHI MASAHITO;AKAMATSU SHIRO;SATOH AKIHIKO;OWADA FUKUO;KATO MASATAKA 发明人 TAKAHASHI MASAHITO;AKAMATSU SHIRO;SATOH AKIHIKO;OWADA FUKUO;KATO MASATAKA
分类号 H01L21/768;G11C7/18;G11C16/04;H01L21/8247;H01L27/10;H01L27/115;H01L29/423;(IPC1-7):H01L21/336 主分类号 H01L21/768
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