发明名称 |
Contactor having LSI-circuit-side contact piece and test-board-side contact piece for testing semiconductor device and manufacturing method thereof |
摘要 |
A contactor is placed between a semiconductor device and a test board. A contact electrode of the contactor electrically connects the semiconductor device to the test board. The contact electrode is formed of a conductive layer provided on an insulating substrate. The contact electrode comprises a first contact piece which contacts a terminal of the semiconductor device, a second contact piece which contacts an electrode of the test board, and a connecting portion which electrically connects the first contact piece and the second contact piece.
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申请公布号 |
US2001024890(A1) |
申请公布日期 |
2001.09.27 |
申请号 |
US20000739288 |
申请日期 |
2000.12.19 |
申请人 |
FUJITSU LIMITED |
发明人 |
MARUYAMA SHIGEYUKI;MATSUKI HIROHISA |
分类号 |
G01R31/26;G01R1/04;G01R1/073;H01L21/66;H01R11/01;H01R33/76;H01R43/00;H05K3/32;(IPC1-7):H05K1/00;H01R12/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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