发明名称 Photothermal coating thickness measurement method involves integrating output of detector which senses thermal radiation from excited coating for standard and dynamic intervals
摘要 Electromagnetic beam (S) is radiated towards a coating (16) from an excitation source (10). Thermal radiation (T) from excited coating is sensed by a detector (18). Detector output is integrated for dynamic and standard intervals and the ratio between values integrated during the two intervals is used for analyzing or thickness measurement of coating. Independent claims are also included for the following: (a) Photothermal analysis device; (b) Photothermal analysis program
申请公布号 DE10013173(A1) 申请公布日期 2001.09.27
申请号 DE20001013173 申请日期 2000.03.17
申请人 WAGNER INTERNATIONAL AG, ALTSTAETTEN 发明人 SCHEIDT, MICHAEL;MOSER, HANSRUEDI;ADAMS, HORST
分类号 G01B11/06;G01B21/08;G01N25/72;(IPC1-7):G01N25/72 主分类号 G01B11/06
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