发明名称 |
Technique to examine an object |
摘要 |
The invention relates to a process to examine at least one object, whereby properties of the object are detected at different times within a spatial-frequency space formed by spacial-frequencies. According to the invention, the process is carried out in such a way that consecutive images are recorded in overlapping areas of the spatial-frequency space and, additionally, in areas of the spatial-frequency space that differ from each other.
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申请公布号 |
US2001024120(A1) |
申请公布日期 |
2001.09.27 |
申请号 |
US20000742470 |
申请日期 |
2000.12.21 |
申请人 |
SHAH NADIM JONI;ZILLES KARL |
发明人 |
SHAH NADIM JONI;ZILLES KARL |
分类号 |
G01N24/08;G01R33/54;G06T7/40;(IPC1-7):G01V3/00 |
主分类号 |
G01N24/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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