发明名称 |
SEMICONDUCTOR TESTING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device realizing a good test in both of a terminal mode and a high resistance mode of driver. SOLUTION: This invention comprises a plurality of comparators with different characteristics for attaining the purpose and is used by switching the comparators according to the mode state of the driver.
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申请公布号 |
JP2001264393(A) |
申请公布日期 |
2001.09.26 |
申请号 |
JP20000079294 |
申请日期 |
2000.03.16 |
申请人 |
HITACHI LTD;HITACHI ELECTRONICS ENG CO LTD |
发明人 |
TAKECHI KEIZO;OSAKI AKIO;HAYASHI YOSHIHIKO;MURATA KAZUHIKO |
分类号 |
G01R31/28;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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