| 摘要 |
<p>PROBLEM TO BE SOLVED: To automatically perform strobe timing control in LSI tester side even in the case of difference in proper strobe timing for inspection by measurement conditions. SOLUTION: A flip-flop operating in synchronizing with an internal clock, aserting the strobe signal at the start of the clock and negating the strobe signal by the time of start of the next clock is produced and the flip-flop is output by way of a delay circuit having a delay time same as the delay element of the signal of an object to be inspected. By using the strobe signal, an optimum strobe signal can be automatically produced with an LSI tester.</p> |
