发明名称 PLANARIZATION METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE: A planarization method for a semiconductor device is provided to reducing the quantity of spin-on-glass(SOG) flowing to a curved part, by forming a spacer on a sidewall of a lower metal interconnection to form the thin curved part. CONSTITUTION: Spacers(24) are formed on both sidewalls of the first metal interconnection(23a,23b) formed on a semiconductor substrate(20). The first interlayer dielectric(25) is covered on the resultant structure. Spin-on-glass(SOG)(28) is covered on the first interlayer dielectric. The SOG is etched back. The second interlayer dielectric(29) is deposited after the etching-back process.
申请公布号 KR20010088091(A) 申请公布日期 2001.09.26
申请号 KR20000012104 申请日期 2000.03.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KOO, TAE HYEON
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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