发明名称 Silicon wafering process flow
摘要 A method of processing a semiconductor wafer sliced from a single-crystal ingot and having front and back surfaces and a peripheral edge comprises the step of plasma jet etching the wafer to reduce the sub-surface wafer damage. The method further comprises high-gloss etching the wafer by subjecting the wafer to a high-gloss etchant that smooths the wafer such that surface roughness and nonspecularly reflected light are reduced. Plasma assisted chemical etching (PACE) is performed on the wafer to improve the flatness and the thickness uniformity of the wafer. The wafer is final polished to further reduce surface roughness and nonspecularly reflected light.
申请公布号 US6294469(B1) 申请公布日期 2001.09.25
申请号 US20000512111 申请日期 2000.02.24
申请人 PLASMASIL, LLC 发明人 KULKARNI MILIND;DESAI ANKUR
分类号 H01L21/306;H01L21/3065;(IPC1-7):H01L21/302 主分类号 H01L21/306
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