发明名称 |
Method and system for detecting faults utilizing an AC power supply |
摘要 |
A system and method for detecting a position of a short in a semiconductor device is disclosed. The semiconductor device includes a semiconductor die and a substrate. The method and system include supplying alternating power to the semiconductor device. The method and system further include sensing a plurality of synchronous temperature variations in proximity to a surface of the semiconductor die while power is supplied to the semiconductor die.
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申请公布号 |
US6294923(B1) |
申请公布日期 |
2001.09.25 |
申请号 |
US19980208801 |
申请日期 |
1998.12.07 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
BLISH, II RICHARD C.;BLACK J. COURTNEY;MASSOODI MOHAMMAD |
分类号 |
G01R31/28;(IPC1-7):G01R31/28;G01R31/311 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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