发明名称 |
METHOD OF PROCESSING SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of processing a semiconductor wafer in which an environmental pollutant is not generated and an environmental load is small. SOLUTION: A semiconductor wafer in which a protective film is formed on a circuit forming face is picked up from a wafer storing section 2 by a wafer transfer section 3. After being positioned by a pre-center section 5, the wafer is mechanically ground in a grinding section 6 so as to have the thickness of the target thickness of thin processing plus a dry etching margin. After being ground, the semiconductor wafer is washed with a washing solution to remove a contamination in a wafer washing section 10, and then is sent to plasma treating sections 4A and 4B to be dry-etched by a plasma etching. In this way, the generation of the environmental pollutant can be prevented when wet etching is performed by using the etching solution and the method of processing a semiconductor wafer with a small environmental load can be realized.
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申请公布号 |
JP2001257186(A) |
申请公布日期 |
2001.09.21 |
申请号 |
JP20000068230 |
申请日期 |
2000.03.13 |
申请人 |
DISCO ABRASIVE SYST LTD;MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KOMA YUTAKA;ARITA KIYOSHI;HAJI HIROSHI;IWAI TETSUHIRO |
分类号 |
H01L21/302;H01L21/304;H01L21/3065;(IPC1-7):H01L21/304;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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