| 摘要 |
PROBLEM TO BE SOLVED: To provide an easy-to-use, good operability IC socket corresponding to high-frequency measurement. SOLUTION: The IC socket 50 corresponding to high-frequency operation is provided with an inspection substrate 24 equipped with a circuit pattern 22 connected with an inspection (measurement) circuit, an IC socket cover 26 shaped like a cover of a box set on the inspection substrate, and a plurality of sheets of contacts 30 arranged under the IC socket cover through a pillar- shaped contact presser 28 made of a non-conductive elastic body. The contact is a J-shaped strip member made of a conductive metal material, arranged in each slot hole 38, comprises a base end part 30a held between the contact presser, the circuit pattern and a support wall of the IC socket cover, a tip end part 30b of an IC constructed as a free end and contacting an IC lead, and a near arc-shaped part 30c in between, and makes a rocking movement around the base part. The contact also has a notched part 52, through which a bar-shaped support body 52 is penetrated.
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