| 摘要 |
PROBLEM TO BE SOLVED: To shorten a test time is a semiconductor test device testing a semiconductor memory. SOLUTION: A test pattern generating device 2 reads and writes a test pattern with regard to each address of semiconductor memories to be tested. A normal/defective condition discriminating device 3 discriminates normal/defective condition of an address from which the data is read out based on data read out from the semiconductor memory and an expected value. A fail memory 4 stores a discriminated result of the normal/defective discriminating device 3. Each of block processing sections 8-1 to 8-4 correspond to each block when the fail memory 4 is divided into plural blocks in according with blocks of the semiconductor memory, the number of defective addresses in a block corresponding to self-processing section are counted, when the number exceeds a threshold value, a test stop signal is outputted.
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