| 摘要 |
PROBLEM TO BE SOLVED: To provide a subordinate unit opposite test system that can reduce a test time for a test opposite to a subordinate unit by conducting subordinate unit opposite tests at the same time. SOLUTION: A test program 11 is a program that is built in a host device to control the entire test. A dual port memory 12 is used for an interface area. A subordinate unit 2 and 2a have a test program 3 and 3a. An address conversion section 13 converts a test address into an address of a common area 23 being the same areas as the test program 3a of the opposite subordinate unit 2a for an opposite test when receiving an access to the test address from the test program 3 in the subordinate unit 2.
|
