发明名称 POSITIVE TEMPERATURE COEFFICIENT THERMISTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a safe structure, where the fragments of the broken positive temperature coefficient thermistor are never left between spring terminals so as not to cause a short circuit between them even if an abnormal voltage is applied to the thermistor to break it down. SOLUTION: In the structure, spring terminals 2a and 2b which press and hold a positive temperature coefficient thermistor device 1 are asymmetrically arranged inside a resin case 3, projections 4a and 4b are arranged inside the resin case 3 opposite to the spring terminals 2a and 2b, respectively, and the positive temperature coefficient thermistor device 1 is held with the spring terminals 2a and 2b and the projections 4a and 4b in the resin case 3. The upper ends of the projections 4a and 4b are set lower than a contact 10 of the spring terminals 2a and 2b, and the height of the projections 4a and 4b which hold the thermistor device 1 are set 3/10 to 1/2 as large as the diameter of the device 1.
申请公布号 JP2001257103(A) 申请公布日期 2001.09.21
申请号 JP20000066466 申请日期 2000.03.10
申请人 NICHICON CORP 发明人 SHIMIZU TATSUYA;OTSUKA KATSUMI;FUJIMOTO SHOICHI
分类号 H01C7/02;(IPC1-7):H01C7/02 主分类号 H01C7/02
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