| 摘要 |
<p>PROBLEM TO BE SOLVED: To solve such a problem that in conventional semiconductor integrated circuit, comparison and discrimination of output data are required to perform in a state in which the prescribed bit pattern is given to detect double access of a word line, a test program is made complex. SOLUTION: This semiconductor integrated circuit is provided with a memory circuit 1, plural bit lines 2, a bit selector 3, plural word lines 4, a word selector 5, a data bus signal line 10, a circuit 11 for test constituted by connecting in parallel switch means whose control terminals are connected to terminal sections of each of the word lines 4 respectively, a dummy bit lines 12 for test connected commonly to the switch means, and a port 13 for test connected to the dummy bit line 12 for test.</p> |
