发明名称 INFRARED SPECTROSCOPIC MEASURING METHOD AND JIG USED FOR MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an infrared spectroscopic measuring method capable of easily realizing analysis of a minute sample. SOLUTION: In this infrared spectroscopic measuring method, sampling of the minute sample in infrared spectroscopy and measurement of the minute sample are executed. In the method, a metal part of a jig having the metal part to be charged is charged, and thereafter the minute sample is sampled by a Coulomb force between the minute sample and the metal part, and infrared spectroscopic measurement of the sampled minute specimen is executed on the metal part as it is.</p>
申请公布号 JP2001255263(A) 申请公布日期 2001.09.21
申请号 JP20000062489 申请日期 2000.03.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 UMEMURA SONOKO;KUROKI HIROSHI;NOMURA KENJI
分类号 G01N1/00;G01N1/02;G01N1/04;G01N21/01;G01N21/27;G01N21/35;(IPC1-7):G01N21/01 主分类号 G01N1/00
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