发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can greatly improve the performance of a semiconductor device in which silicon carbide is used, and to provide a manufacturing method thereof. SOLUTION: A semiconductor device, where silicon carbide is used, is manufactured by using crystalline polymorphism silicon carbide which differs with a substrate part and a channel part. The crystalline polymorphism of a substrate part is made a 4H type or 6H type and the crystalline polymorphism of a channel part is made as any of 6H type, 3C type and 15R type. In the process for forming a channel part, a part of first crystalline polymorphic silicon carbide is etched and second crystalline polymorphic silicon carbide is formed in the entire or a part of the etched place and the conductivity type of first and second crystalline polymorphic silicon carbide is controlled for forming a desired semiconductor device.
申请公布号 JP2001257347(A) 申请公布日期 2001.09.21
申请号 JP20000066914 申请日期 2000.03.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 TARUI YOICHIRO;IMAIZUMI MASAYUKI;SUGIMOTO HIROSHI;OTSUKA KENICHI;TAKAMI TETSUYA
分类号 H01L21/336;H01L29/12;H01L29/24;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/336
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