发明名称 CERAMIC SUBSTRATE FOR SEMICONDUCTOR MANUFACTURING AND CHECKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a ceramic substrate for a semiconductor manufacturing and checking device which hardly generates degradation caused by oxidation and has no dropout of a conductor wire or no variation of a resistance value even if used at a high temperature of >=200 deg.C. SOLUTION: A conductor made of one or two circuit(s) is formed on a surface or inside a ceramic substrate for a semiconductor manufacturing and checking device. The ceramic substrate for a semiconductor manufacturing and checking device has features of the conductor being electrically connected with a conductor wire and a part at least of the connecting portion and the conductor wire being covered with non-oxide metal.
申请公布号 JP2001257196(A) 申请公布日期 2001.09.21
申请号 JP20000065263 申请日期 2000.03.09
申请人 IBIDEN CO LTD 发明人 HIRAMATSU YASUJI;ITO YASUTAKA
分类号 H05B3/20;H01L21/302;H01L21/3065;H01L21/66;H05B3/02;(IPC1-7):H01L21/306 主分类号 H05B3/20
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