发明名称 TEST SUPPORTING DEVICE
摘要 PROBLEM TO BE SOLVED: To smoothly input a work to prepare a test sequence to operate the test of an objective system without any error at the time of developing software. SOLUTION: This test supporting device is provided with a state transition chart 101 including a state in transition to the next and an event causing the state transition, an event state extracting part 701 for extracting the state included in the state transition chart and the event, and an event state definition preparing part 702 for generating an event state definition chart defining the contents of the event based on the extracted state and the event.
申请公布号 JP2001256078(A) 申请公布日期 2001.09.21
申请号 JP20010023889 申请日期 2001.01.31
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAJIMA TAKESHI
分类号 G06F11/28;G06F11/22;H04M3/22;H04Q3/545 主分类号 G06F11/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利