| 摘要 |
PROBLEM TO BE SOLVED: To execute, with a simple formation, magnetization modulation of a magnetic substance chip installed on the free end of a cantilever, concerning a magnetic field measuring device for measuring a local magnetic field near the sample surface by applying technique of a scanning probe microscope. SOLUTION: A coil 8 having a sufficiently large diameter relative to the magnetic substance chip 6 is installed outside a probe 3, and an alternating- current magnetic field having a small space change is given to the magnetic substance chip 6 by the coil 8 to give magnetization modulation to the magnetic substance chip 6, and a magnetic force given to the magnetic substance chip 6 by the magnetic field from the sample 1 is changed periodically to vibrate the free end of the cantilever 4. The vibration of the cantilever 4 is detected by a deflection detector 10, and a component synchronized with the alternating- current magnetic field is detected by a lock-in detector 11 from among output signals of the deflection detector 10, to thereby measure the local magnetic field near the surface of the sample 1.
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