发明名称 Semiconductor device having ferroelectric capacitor and method for manufacturing the same
摘要 There is provided a semiconductor device having a ferroelectric capacitor formed on a semiconductor substrate covered with an insulator film, wherein the ferroelectric capacitor comprises: a bottom electrode formed on the insulator film; a ferroelectric film formed on the bottom electrode; and a top electrode formed on the ferroelectric film. The ferroelectric film has a stacked structure of either of two-layer-ferroelectric film or three-layer-ferroelectric film. The upper ferroelectric film is metallized and prevents hydrogen from diffusing in lower ferroelectric layer. Crystal grains of the stacked ferroelectric films are preferably different.
申请公布号 US2001022372(A1) 申请公布日期 2001.09.20
申请号 US20010801920 申请日期 2001.03.09
申请人 KANAYA HIROYUKI;TANIGUCHI YASUYUKI;OZAKI TOHRU;KUMURA YOSHINORI 发明人 KANAYA HIROYUKI;TANIGUCHI YASUYUKI;OZAKI TOHRU;KUMURA YOSHINORI
分类号 H01L21/02;H01L21/311;H01L21/3213;H01L21/8246;H01L27/115;(IPC1-7):H01L21/00 主分类号 H01L21/02
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