发明名称 Semiconductor devices and methods for manufacturing the same
摘要 Certain embodiments of the present invention relate to a method for manufacturing a semiconductor device, in which, when a cell capacitor of a DRAM and a capacitor element in an analog element region are mix-mounted on the same chip, the manufacturing steps can be simplified. First, the lower electrodes 55a and 55b of the capacitor elements 600a and 600b, and the storage nodes 53a and 53b of the cell capacitors 700a and 700b are simultaneously formed. Next, a dielectric layer (ON layer 61) of the capacitor elements 600a and 600b, and a dielectric layer (ON layer 61) of the cell capacitors 700a and 700b are simultaneously formed. Then, the upper electrodes 69a and 69b of the capacitor elements 600a and 600b and the cell plate 67 of the cell capacitors 700a and 700b are simultaneously formed.
申请公布号 US2001023098(A1) 申请公布日期 2001.09.20
申请号 US20010759666 申请日期 2001.01.13
申请人 TSUGANE HIROAKI;SATO HISAKATSU 发明人 TSUGANE HIROAKI;SATO HISAKATSU
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/06;H01L27/10;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L27/04
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