发明名称 Method of forming conducting diffusion barriers
摘要 <p>A method of forming conducting diffusion barriers by depositing an initial film and implanting ions to modify the film is provided. An initial film having good step coverage is deposited over a semiconductor substrate. The initial material need not have the desired properties for a conducting diffusion barrier, but preferably contains one or more elements to be used in forming a desired film with the appropriate properties. The initial material is deposited by CVD, PECVD or IMP deposition. Ions are preferably implanted using plasma immersion ion implantation (PIII), although other methods are also provided. The method of the present invention produces binary, ternary, quaternary and other more complex films, while providing adequate step coverage. <IMAGE></p>
申请公布号 EP1134802(A2) 申请公布日期 2001.09.19
申请号 EP20010302248 申请日期 2001.03.12
申请人 SHARP KABUSHIKI KAISHA 发明人 MA, YANJUN
分类号 C23C16/34;H01L21/20;H01L21/265;H01L21/28;H01L21/768;(IPC1-7):H01L21/768 主分类号 C23C16/34
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