发明名称 |
Semiconductor device and method for manufacturing the same |
摘要 |
A semiconductor device which is mounted with a plurality of semiconductor chips. The fraction defective is low when the device is manufactured, and the efficiency of inspection is high. A method for manufacturing such a semiconductor device is also disclosed. A plurality of kinds of semiconductor chips 1 are COB-mounted on a substrate 2 and the surface of the substrate 2 mounted with the chips 1 is encapsulated with a resin 3. Then all the chips 1 mounted on the substrate 2 are inspected at once. Semiconductor devices 10 are produced by cutting the substrate 2 into pairs of adjacently arranged two different kinds of semiconductor chips 1 together which are judged to be nondefective chips.
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申请公布号 |
US6291309(B1) |
申请公布日期 |
2001.09.18 |
申请号 |
US20000554632 |
申请日期 |
2000.05.16 |
申请人 |
NIIGATA SEIMITSU CO., LTD. |
发明人 |
IKEDA KOUICHI;IKEDA TAKESHI |
分类号 |
H01L21/56;H01L21/66;H01L23/498;H01L25/065;H05K3/00;H05K3/40;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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