发明名称 METHOD FOR POLISHING WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for polishing a wafer, capable of optimizing the effect of a retainer ring and preventing sagging of the peripheral part of the wafer. SOLUTION: In the method for polishing the wafer 4, slurry is dripped on a surface plate 3 fitted with a polishing cloth 2 and a plate 6 holding the wafer 4 is pressed and rotated in order to polish the surface of the wafer 4. The retainer ring 5 is mounted on the plate 6 in a manner such as to form clearance C in the peripheral part of the wafer 4 for the purpose of polishing the wafer 4 with the clearance C adjusted automatically.
申请公布号 JP2001252863(A) 申请公布日期 2001.09.18
申请号 JP20000062184 申请日期 2000.03.07
申请人 TOSHIBA CERAMICS CO LTD 发明人 SAKAMOTO TAKAO;KAWAMOTO SHINYA;KAMITARI KATSUAKI;KOJIMA KATSUYOSHI;SAITO MASAYOSHI;HOSHI YOSHIHIKO
分类号 B24B7/17;B24B37/07;H01L21/304 主分类号 B24B7/17
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