发明名称 |
METHOD FOR POLISHING WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for polishing a wafer, capable of optimizing the effect of a retainer ring and preventing sagging of the peripheral part of the wafer. SOLUTION: In the method for polishing the wafer 4, slurry is dripped on a surface plate 3 fitted with a polishing cloth 2 and a plate 6 holding the wafer 4 is pressed and rotated in order to polish the surface of the wafer 4. The retainer ring 5 is mounted on the plate 6 in a manner such as to form clearance C in the peripheral part of the wafer 4 for the purpose of polishing the wafer 4 with the clearance C adjusted automatically. |
申请公布号 |
JP2001252863(A) |
申请公布日期 |
2001.09.18 |
申请号 |
JP20000062184 |
申请日期 |
2000.03.07 |
申请人 |
TOSHIBA CERAMICS CO LTD |
发明人 |
SAKAMOTO TAKAO;KAWAMOTO SHINYA;KAMITARI KATSUAKI;KOJIMA KATSUYOSHI;SAITO MASAYOSHI;HOSHI YOSHIHIKO |
分类号 |
B24B7/17;B24B37/07;H01L21/304 |
主分类号 |
B24B7/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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