发明名称 Method of operating a programmable, non-volatile memory device
摘要 The invention relates to an erasable non-volatile memory in which a diode is formed at each point of intersection between the x-selection lines (Ki) and y-selection lines (Rj), of which diode the anode and cathode are conductively connected to the x- and y-selection lines. The diodes are formed in hydrogenated amorphous silicon or silicon compounds such as amorphous Si-xGex. Writing takes place by means of a current pulse through selected diodes. The current in the forward direction becomes much lower, for example a few hundred times lower, than in diodes which are not selected, probably owing to degradation in the semiconductor material. The diodes may be returned to their original state again (i.e. be erased) through heating, for example at a temperature of 200° C. during 100 minutes. Preferably, the diodes are formed by Schottky diodes because the characteristic in the reverse direction does not (substantially) change in this type of diode. The Schottky diodes may be formed in the transitional region between the amorphous intrinsic semiconductor material (6) and the selection lines (Ki).
申请公布号 US6291836(B1) 申请公布日期 2001.09.18
申请号 US19970866649 申请日期 1997.05.30
申请人 U. S. PHILIPS CORPORATION 发明人 KRAMER NIELS;NIESTEN MAARTEN J. H.;LODDERS WILHELMUS H. M.;OVERSLUIZEN GERRIT
分类号 G11C17/06;G11C11/36;G11C16/02;G11C17/14;H01L21/3065;H01L21/822;H01L27/10;H01L27/105;H01L27/115;(IPC1-7):H01L21/824;H01L21/824 主分类号 G11C17/06
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