发明名称 Semiconductor device
摘要 An active region 30 is formed on a substrate 3, which is made of SiC, GaN, or GaAs, for example, by alternately layering undoped layers 22 with a thickness of for example about 50 nm and n-type doped layers 23 with a thickness (for example, about 10 nm) that is thin enough that quantum effects can be achieved. Carriers spread out into the undoped layers 22 from sub-bands of the n-type doped layers 23 that occur due to quantum effects. In the undoped layers 22, which have a low concentration of impurities, the scattering of impurities is reduced, and therefore a high carrier mobility can be obtained there, and when the entire active region 30 has become depleted, a large withstand voltage value can be obtained due to the undoped layers 22 by taking advantage of the fact that there are no more carriers in the active region 30. <IMAGE>
申请公布号 AU1416601(A) 申请公布日期 2001.09.17
申请号 AU20010014166 申请日期 2000.11.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 TOSHIYA YOKOGAWA;KUNIMASA TAKAHASHI;OSAMU KUSUMOTO;MAKOTO KITABATAKE;TAKESHI UENOYAMA
分类号 H01L29/04;H01L29/15;H01L29/20;H01L29/24;H01L29/36;H01L29/812;H01L29/872 主分类号 H01L29/04
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