发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To recognize defective marks on semiconductor chips at the same time and to securely apply die bonding to nondefective semiconductor chips for a short time. SOLUTION: A semiconductor wafer W transferred from a cassette lifter 2 is positioned and fixed by a wafer correction chute, and then a wafer picture recognition camera 4 picks up the entire picture of the semiconductor wafer W. A wafer map is produced from the fetched picture data, and a map coordinate in which a defective semiconductor chip is located is recognized. When picking up, only the position of a nondefective semiconductor chip is recognized by the camera 12 for recognizing chips according to the map coordinate and it is picked up thereafter.
申请公布号 JP2001250834(A) 申请公布日期 2001.09.14
申请号 JP20000060828 申请日期 2000.03.06
申请人 HITACHI LTD;HITACHI TOKYO ELECTRONICS CO LTD 发明人 KOBASHI HIDEHARU;HOSAKA KOJI
分类号 H01L21/66;H01L21/52;(IPC1-7):H01L21/52 主分类号 H01L21/66
代理机构 代理人
主权项
地址