发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To recognize defective marks on semiconductor chips at the same time and to securely apply die bonding to nondefective semiconductor chips for a short time. SOLUTION: A semiconductor wafer W transferred from a cassette lifter 2 is positioned and fixed by a wafer correction chute, and then a wafer picture recognition camera 4 picks up the entire picture of the semiconductor wafer W. A wafer map is produced from the fetched picture data, and a map coordinate in which a defective semiconductor chip is located is recognized. When picking up, only the position of a nondefective semiconductor chip is recognized by the camera 12 for recognizing chips according to the map coordinate and it is picked up thereafter.
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申请公布号 |
JP2001250834(A) |
申请公布日期 |
2001.09.14 |
申请号 |
JP20000060828 |
申请日期 |
2000.03.06 |
申请人 |
HITACHI LTD;HITACHI TOKYO ELECTRONICS CO LTD |
发明人 |
KOBASHI HIDEHARU;HOSAKA KOJI |
分类号 |
H01L21/66;H01L21/52;(IPC1-7):H01L21/52 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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