发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND ACTIVE MATRIX SUBSTRATE, AND ELECTRO-OPTIC DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device and an active matrix substrate, and an electro-optic device, by which a variation in the LDD (lightly doped drain) length of a TFT is suppressed and displacement between a gate electrode and an LDD structure is eliminated so that deterioration due to aging can be prevented. SOLUTION: The method of manufacturing a semiconductor device comprises a gate electrode forming process for patterning an insulating film for a mask by using a resist film 204a as a mask to form a hard mask 203a and patterning a conductive film for forming a gate electrode by using the hard mask 203a pattern as a mask to form a gate electrode 5 smaller than the hard mask 203a pattern, a high-concentration impurity introducing process for introducing a high-concentration impurity into a silicon film 3 by using the hard mask 203a and the gate electrode 5 as a mask, and a low-concentration impurity introducing process for removing the hard mask 203a and introducing a low- concentration impurity into the silicon film 3 by using the gate electrode 5 as a mask.</p>
申请公布号 JP2001250955(A) 申请公布日期 2001.09.14
申请号 JP20000062362 申请日期 2000.03.07
申请人 SEIKO EPSON CORP;MITSUBISHI ELECTRIC CORP 发明人 MURAI ICHIRO;TAKEGUCHI TORU
分类号 G02F1/136;G02F1/1368;G09F9/00;G09F9/30;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
代理机构 代理人
主权项
地址