发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND ACTIVE MATRIX SUBSTRATE, AND ELECTRO-OPTIC DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device and an active matrix substrate, and an electro-optic device, by which a variation in the LDD (lightly doped drain) length of a TFT is suppressed and displacement between a gate electrode and an LDD structure is eliminated so that deterioration due to aging can be prevented. SOLUTION: The method of manufacturing a semiconductor device comprises a gate electrode forming process for patterning an insulating film for a mask by using a resist film 204a as a mask to form a hard mask 203a and patterning a conductive film for forming a gate electrode by using the hard mask 203a pattern as a mask to form a gate electrode 5 smaller than the hard mask 203a pattern, a high-concentration impurity introducing process for introducing a high-concentration impurity into a silicon film 3 by using the hard mask 203a and the gate electrode 5 as a mask, and a low-concentration impurity introducing process for removing the hard mask 203a and introducing a low- concentration impurity into the silicon film 3 by using the gate electrode 5 as a mask.</p> |
申请公布号 |
JP2001250955(A) |
申请公布日期 |
2001.09.14 |
申请号 |
JP20000062362 |
申请日期 |
2000.03.07 |
申请人 |
SEIKO EPSON CORP;MITSUBISHI ELECTRIC CORP |
发明人 |
MURAI ICHIRO;TAKEGUCHI TORU |
分类号 |
G02F1/136;G02F1/1368;G09F9/00;G09F9/30;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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