发明名称 HIGH-TEMPERATURE ELECTROSTATIC CHUCK
摘要 <p>PROBLEM TO BE SOLVED: To provide a high-temperature electrostatic chuck. SOLUTION: This electrostatic chuck has an expansion joint between a chuck and a heat transfer body. The expansion joint provides a hermetic seal, absorbs the difference in thermal expansion between the chuck and heat transfer body, and/or controls the quantity of heat conducted from the chuck to the heat transfer body. A plenum provided between surface of the chuck and the surface of the heat transfer body separated from the surface of the chuck is filled with a heat transfer gas which is made to pass through a gas passage, such as the lift pin hole of the chuck for cooling the back face of a substrate supported on the chuck. The heat transfer gas in the plenum conducts heat from the chuck to the heat transfer body. Since this chuck can operate at a temperature of >200 deg.C, the chuck can be used for plasma etching of a noble metal, such as Pt, etc., which is required to be etched at a high temperature for evaporating a low-volatility etched product.</p>
申请公布号 JP2001250816(A) 申请公布日期 2001.09.14
申请号 JP20000391452 申请日期 2000.12.22
申请人 LAM RES CORP 发明人 SEXTON GREG;KENNARD MARK ALLEN;SCHOEPP ALAN
分类号 C23C14/50;C23C16/458;H01L21/205;H01L21/302;H01L21/3065;H01L21/683;(IPC1-7):H01L21/306;H01L21/68 主分类号 C23C14/50
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