| 摘要 |
<p>A multifunctional infrared spectrometer system (20) has an interferometer (27) which receives the infrared beam from a source (22) and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors (77, 88). A multi-position mirror element (64) mounted at a junction position (63) receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors (77, 88). One of the branch beam paths may include a sample holder (80) at the sample position which can index between a position at which a sample is analyzed, to a reference material position, or to a pass-through position for calibration purposes. The multi-position mirror element (64) may also be indexed to direct the beam on a branch path to a fiber optic cable (70, 76) including a probe (71). The multi-position mirror element (64) may be moved to a position at which the beam is directed on a beam path to and through an integrating sphere to a sample.</p> |
