发明名称 |
FUSE CIRCUIT FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fuse circuit for a semiconductor device is provided to prevent the malfunction of a fuse device by dividing certainly the cut-off state and the previous cut-off state of the fuse device. CONSTITUTION: A fuse device(F4) having resistance is connected to a voltage power supply terminal(VDD). The voltage of the voltage power supply terminal(VDD) is divided by a predetermined ratio. The first load device(R2) connects with the fuse device(F4) in series, and outputs the divided voltage with the resistance of the fuse device(F4). The second and the third load devices(R3, R4) are connected between the voltage power supply terminal(VDD) and a ground terminal(GND) in series. A switching circuit(TR3) is arranged between the second and the third load devices(R2, R3), receives the divided voltage, and generates an output signal corresponding to the cut-off or the connection of the fuse device(F4), so that an opening or closing operation is performed.
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申请公布号 |
KR20010086506(A) |
申请公布日期 |
2001.09.13 |
申请号 |
KR20000010429 |
申请日期 |
2000.03.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYEONG YUN;KIM, GANG MIN |
分类号 |
H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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主权项 |
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地址 |
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